The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2005
Filed:
Apr. 07, 2004
Yukihiro Sakata, Kawasaki, JP;
Yoshiyuki Oomori, Kure, JP;
Hideki Shindo, Kure, JP;
Kazushi Noguchi, Kure, JP;
Yukihiro Sakata, Kawasaki, JP;
Yoshiyuki Oomori, Kure, JP;
Hideki Shindo, Kure, JP;
Kazushi Noguchi, Kure, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A reference fixture () for a roundness measuring instrument performs acquisition of origin information of a roundness measuring instrument () including a workpiece rotary mechanism () on which a workpiece is set and a probe () provided with a stylus () and also performs calibration of the probe (). The reference fixture () includes a mount (), a calibration master () provided on a top face of the mount () for calibrating the sensitivity of the probe (), an origin ball () disposed above the calibration master () for providing the origin information of the roundness measuring instrument () by the stylus () of the probe (), and a holder () that holds the origin ball ().