The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2005
Filed:
Jan. 18, 2001
Applicants:
Bulent Dervisoglu, Mountain View, CA (US);
Laurence H. Cooke, Los Gatos, CA (US);
Inventors:
Bulent Dervisoglu, Mountain View, CA (US);
Laurence H. Cooke, Los Gatos, CA (US);
Assignee:
Cadence Design Systems, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/28 ; G06F017/50 ;
U.S. Cl.
CPC ...
Abstract
A hierarchical test control network for an integrated circuit includes a top-level test control circuit block having a chip access port (CAP) controller. The hierarchical test control network also has multiple lower-level test control circuit blocks connected to the top-level test control circuit block in a hierarchical structure. Each of the lower-level test control circuit blocks are a socket access port (SAP) controller. Test operation is transferred downward and upwards within said hierarchical structure.