The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 2005
Filed:
Jun. 28, 2001
Darren Slawecki, Santa Clara, CA (US);
Stephan Rotter, Santa Clara, CA (US);
Darren Slawecki, Santa Clara, CA (US);
Stephan Rotter, Santa Clara, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An apparatus and a method are disclosed to save on the integrated circuit die(s) the state of the scan latches coupled to an integrated circuit in a memory unit during an exercise of the integrated circuit by a coupled tester, to compare on the die the saved states to the state of the scan latches in a subsequent exercise of the integrated circuit, and to transmit the result of the comparison to the tester, rather to have to transmit to the tester the scan latch states for a comparison analysis after each exercise of the integrated circuit. The apparatus and method include deriving on the die a signature of the saved scan latch states, and comparing on the die the signature of an exercise of the integrated circuit and subsequently exercise of the integrated circuit. The invention also includes generating on the die a scan latch latching clock for consecutively exercising the integrated circuit without determining off the die, and sending to the die, for each iteration, the latching clock.