The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2005
Filed:
Jul. 21, 2003
Applicant:
Ziyang LU, Camas, WA (US);
Inventor:
Ziyang Lu, Camas, WA (US);
Assignee:
Credence Systems Corporation, Milpitas, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract
A method of verifying test data for testing an integrated circuit device having multiple device time domains includes selecting a virtual tester time domain and, if the cycle duration of the virtual tester time domain is equal to the cycle duration of one of the multiple device time domains, translating the test data for each device time domain other than that one time domain to the virtual tester time domain and otherwise translating the test data for each device time domain to the virtual tester time domain. The translated test data is then applied to a device logic simulator that simulates integrated circuit device.