The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2005

Filed:

Feb. 10, 2004
Applicants:

Minh Van Ngo, Fremont, CA (US);

Robert Huertas, Hollister, CA (US);

Hieu Pham, Milpitas, CA (US);

Inventors:

Minh Van Ngo, Fremont, CA (US);

Robert Huertas, Hollister, CA (US);

Hieu Pham, Milpitas, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L021/44 ;
U.S. Cl.
CPC ...
Abstract

An exposed surface of inlaid Cu is plasma treated for improved capping layer adhesion while controlling plasma conditions to avoid damaging porous low-k materials. Embodiments include forming a dual damascene opening in a porous dielectric material having a dielectric constant (k) of up to 2.4, e.g., 2.0 to 2.2, filling the opening with Cu, conducting CMP, plasma treating the exposed Cu surface in NHor Hat a low power, e.g., 75 to 125 watts, for a short period of time, e.g., 2 to 8 seconds, without etching the porous low-k material and depositing a capping layer, e.g., silicon nitride or silicon carbide.


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