The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
May. 20, 2003
Hideo Toraya, Tachikawa, JP;
Kazuhiko Omote, Akiruno, JP;
Hideo Toraya, Tachikawa, JP;
Kazuhiko Omote, Akiruno, JP;
Rigaku Corporation, Akishima, JP;
Abstract
The preferred orientation of a polycrystalline material is estimated using one diffraction peak. An orientation density distribution function ρ is assumed to be axisymmetric around a normal direction of the surface of a sample made of a polycrystalline material. The function ρ may be a Gaussian function or a March-Dollase function. An X-ray is incident upon the surface of the sample at an incident angle α and the intensity of a diffraction X-ray is measured. The change of intensity of the diffraction X-ray is measured with the incident angle α being changed to attain a measurement rocking curve. A theoretical diffraction X-ray intensity is calculated based on the orientation density distribution function ρ. The characteristic parameter of the function ρ is determined so that the theoretical rocking curve approaches the measurement rocking curve as closely as possible, whereby the orientation density distribution function ρ can be determined.