The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Dec. 08, 2000
Michael Nahum, Kirkland, WA (US);
Patrick H. Mawet, Snohomish, WA (US);
Michael Nahum, Kirkland, WA (US);
Patrick H. Mawet, Snohomish, WA (US);
Mitutoyo Corporation, Kawasaki, JP;
Abstract
An image comparison method and an interpolation method to determine the image offset corresponding to the extreme value of the comparison contributes to systematic errors in estimating the displacement of the surface from the images. The systematic errors are rejected by correlation-based comparison systems and methods which reduce the curvature of the correlation function for offsets that bound the extreme value, and by interpolation systems and methods that are relatively insensitive to the asymmetry of the correlation function value points selected as the basis for the interpolation. These systems and methods allow fast, highly accurate, displacement determinations using relatively simplified calculations and relatively few correlation function value points.