The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2005

Filed:

Feb. 04, 2003
Applicants:

Kyung Joon Han, Palo Alto, CA (US);

Steve K. Hsia, San Jose, CA (US);

Joo Weon Park, Pleasanton, CA (US);

Gyu-wan Kwon, Cupertino, CA (US);

Jong Seuk Lee, Palo Alto, CA (US);

Inventors:

Kyung Joon Han, Palo Alto, CA (US);

Steve K. Hsia, San Jose, CA (US);

Joo Weon Park, Pleasanton, CA (US);

Gyu-Wan Kwon, Cupertino, CA (US);

Jong Seuk Lee, Palo Alto, CA (US);

Assignee:

NexFlash Technologies, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L029/788 ;
U.S. Cl.
CPC ...
Abstract

An asymmetrical virtual ground single transistor floating gate memory cell has a floating gate that overlies a channel region in a p-well, the channel region lying between a heavily doped n+ drain region and a lightly doped n− source region. A heavily doped p+ region known as a 'halo' is disposed in the channel adjacent the heavily doped n+ drain. The floating gate is spaced away from the channel region by a generally thin tunnel oxide. A lightly doped source with a graded source/channel junction reduces source side CHE generation. In one variation, a thicker oxide between the source and the floating gate reduces CHE injection from the source side. A heavily doped drain with a halo implant in the channel adjacent the drain enhances drain side CHE generation.


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