The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2005
Filed:
Nov. 24, 1999
Applicants:
Daniel Van Blerkom, Burbank, CA (US);
Alexander Krymski, Montrose, CA (US);
Abe Kotlyar, Sun Valley, CA (US);
Nikolai Bock, Pasadena, CA (US);
Anders Andersson, Pasadena, CA (US);
Barmak Mansoorian, Los Angeles, CA (US);
Inventors:
Daniel Van Blerkom, Burbank, CA (US);
Alexander Krymski, Montrose, CA (US);
Abe Kotlyar, Sun Valley, CA (US);
Nikolai Bock, Pasadena, CA (US);
Anders Andersson, Pasadena, CA (US);
Barmak Mansoorian, Los Angeles, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N003/14 ; H04N005/335 ;
U.S. Cl.
CPC ...
Abstract
Imaging sensors having dual-port for digital readout to pipeline readout processes of two different groups of pixels.
Blerkom, Daniel. (2005). Semiconductor imaging sensor array devices with dual-port digital readout (U.S. Patent No. 6870565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6870565
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile