The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2005

Filed:

Jul. 02, 2004
Applicant:

Paolo Dalla Ricca, Fremont, CA (US);

Inventor:

Paolo Dalla Ricca, Fremont, CA (US);

Assignee:

Credence Systems Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ; G01R031/26 ;
U.S. Cl.
CPC ...
Abstract

An analog test instrument used in an apparatus for testing electronic devices has multiple analog modules for supplying test signals to analog pins of a device under test and receiving response signals from the analog pins. The analog modules may be of the same type or of different types. The analog test instrument also has programmable devices that control in an independent manner the triggering, clocking, and generation of the test signals supplied by each of the analog modules, so that test signals of various timings, speeds and waveforms may be generated.


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