The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2005

Filed:

Dec. 10, 2001
Applicants:

Benoit Nadeau-dostie, Aylmer, CA;

Jean-françois Côté, Chelsea, CA;

Inventors:

Benoit Nadeau-Dostie, Aylmer, CA;

Jean-François Côté, Chelsea, CA;

Assignee:

LogicVision, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

A method of designing integrated circuits having an hierarchical structure for quiescent current testing, and the circuit which results therefrom is disclosed. The method comprises analyzing each of one or more selected hierarchical blocks independently of other selected blocks identify any circuit states of each block which could result in elevated quiescent current levels during quiescent current testing of the circuit, the analysis beginning with blocks at a lowest level of hierarchy and proceeding in sequence through each level of design hierarchy to a highest level of hierarchy containing a top-level block; and calculating a fault coverage for each selected block.


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