The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2005
Filed:
Aug. 15, 2000
Paul Phuc Tran, Milpitas, CA (US);
Wei Qian, Sunnyvale, CA (US);
Paul Phuc Tran, Milpitas, CA (US);
Wei Qian, Sunnyvale, CA (US);
ProMOS Technologies Inc., Hsing-Chu, TW;
Abstract
The present invention provides a method and system for calibration of writing to an optical medium. The method includes: sampling marks in a calibration area of the optical medium; and converting the sampled marks into a digital format utilizing an ADC, the ADC also utilized by a servo control. The present invention provides a controller with an integrated servo and recording processor which allows a single ADC to be used for converting sample marks used in calibrating the writing to an optical media. No separate subsystem for converting sample marks is thus necessary. Less components are required, reducing the cost of manufacturing the controller. With less components, the risk of component failure is reduced as well.