The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6866982 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 15, 2005

Filed:

Dec. 27, 2002
Applicants:

Hideto Kato, Gunma-ken, JP;

Yoshinori Hirano, Gunma-ken, JP;

Toshihiko Fujii, Gunma-ken, JP;

Hiromasa Yamaguchi, Gunma-ken, JP;

Inventors:

Hideto Kato, Gunma-ken, JP;

Yoshinori Hirano, Gunma-ken, JP;

Toshihiko Fujii, Gunma-ken, JP;

Hiromasa Yamaguchi, Gunma-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F007/004 ;
U.S. Cl.
CPC ...
Abstract

A resist composition comprising (A) a substantially alkali-insoluble polymer having acidic functional groups protected with acid labile groups, which becomes alkali soluble upon elimination of the acid labile groups, (B) a photoacid generator, and (C) a nonionic fluorinated organosiloxane compound consisting of perfluoroalkyl-containing siloxane bonds and polyoxyethylene type polyether bonds is exposed to UV having a wavelength of at least 150 nm and developed with an alkaline solution to form a pattern without leaving scum.


Find Patent Forward Citations

Kato, Hideto. (2005). Resist composition and patterning process (U.S. Patent No. 6866982). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6866982

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