The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Aug. 28, 2001
Takehiko Shimomura, Tokyo, JP;
Masayuki Konishi, Tokyo, JP;
Takehiko Shimomura, Tokyo, JP;
Masayuki Konishi, Tokyo, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
There is provided a scan test system comprising: a semiconductor device including a scan register connected between an input/output pin on an analog input side and an internal system logic; a semiconductor device including a scan register connected between an input/output pin on an analog output side and an analog sensor; and an analog wiring connecting the input/output pins each other. Thus, the scan register can be chained to thereby constitute a boundary scan register chain, and thereby JTAG control can be carried out by use of TAPC. Therefore, monitoring inspection where probes are set up by high-density-assembling of semiconductor devices and the multiple pins of low-cost devices, can be achieved.