The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6865296 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 08, 2005

Filed:

Jun. 05, 2001
Applicant:

Kenji Nagao, Kanagawa, JP;

Inventor:

Kenji Nagao, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K009/62 ;
U.S. Cl.
CPC ...
Abstract

With respect to two pattern sets obtained on different conditions, a feature-extraction matrix, which maximizes between-class scatter and minimizes within-class scatter, is found respectively. A first feature amount is calculated using one of the feature-extraction matrices. The first feature amount and the two matrices are retained in a referential database. A pattern is determined to a second feature amount—extracted by applying another feature-extraction matrix to a pattern input—by extracting a most similar element out of the first feature amount retained in the referential database.


Find Patent Forward Citations

Nagao, Kenji. (2005). Pattern recognition method, pattern check method and pattern recognition apparatus as well as pattern check apparatus using the same methods (U.S. Patent No. 6865296). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6865296

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