The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2005
Filed:
Aug. 06, 2003
Applicant:
Kuan-min Lin, Taipei, TW;
Inventor:
Kuan-Min Lin, Taipei, TW;
Assignee:
Taiwan Semiconductor Manufacturing Co. Ltd, Hsin Chu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/02 ; G01R031/42 ;
U.S. Cl.
CPC ...
Abstract
An alignment station for aligning probe needles on a probe card prior to testing of integrated circuits on a wafer. The alignment station includes a probe card support or chuck for receiving a probe card and mask carrier arms which support a needle alignment mask and are operable to selectively place the mask into contact with the probe needles and raise the mask out of contact with the probe needles.
Quick Actions:
Lin, Kuan-Min. (2005). Flip-over alignment station for probe needle adjustment (U.S. Patent No. 6864697). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6864697
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile