The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
Feb. 22, 2002
Nikos Kaburlasos, Sacramento, CA (US);
James Little, Sacramento, CA (US);
Vaishali Nikhade, Fair Oaks, CA (US);
Nikos Kaburlasos, Sacramento, CA (US);
James Little, Sacramento, CA (US);
Vaishali Nikhade, Fair Oaks, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A method and system for performing integrated adjustable short-haul/long-haul time domain reflectometry (TDR). A TDR pulse count is set to a predetermined number. Next, a TDR pulse is transmitted through a cable. The width of the TDR pulse is a function of the multiplication of the TDR pulse count with the period of a TDR clock. It is then determined whether the TDR pulse has been reflected back. If the TDR pulse has not been reflected, the TDR pulse count is successively increased to successively increase the width of the transmitted TDR pulse until a reflection is detected—indicating an open in the cable. Furthermore, it eliminates false detections of cable opens. Moreover, the system can be combined into a line interface unit (LIU) integrated circuit such that TDR functionality can be performed automatically without the use of a technician.