The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2005

Filed:

Oct. 18, 2001
Applicants:

Brian K. Kirkpatrick, Allen, TX (US);

Michael Morrison, Tempe, AZ (US);

Andrew J. Mckerrow, Dallas, TX (US);

Kenneth J. Newton, McKinney, TX (US);

Dirk N. Anderson, Plano, TX (US);

Inventors:

Brian K. Kirkpatrick, Allen, TX (US);

Michael Morrison, Tempe, AZ (US);

Andrew J. McKerrow, Dallas, TX (US);

Kenneth J. Newton, McKinney, TX (US);

Dirk N. Anderson, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L021/4763 ;
U.S. Cl.
CPC ...
Abstract

A low-k dielectric layer () is treated with a dry-wet (D-W) or dry-wet-dry (D-W-D) process to improve patterning Resist poisoning occurs due to an interaction between low-k films (), such as OSG, and DUV resist (). The D-W or D-W-D treatment is performed to either pretreat a low-k dielectric () before forming the pattern () or during a rework of the pattern ().


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