The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2005
Filed:
Jul. 05, 2001
Tatuhisa Fujii, Fukuyama, JP;
Shogo Ishioka, Fukayasu-gun, JP;
Tatuhisa Fujii, Fukuyama, JP;
Shogo Ishioka, Fukayasu-gun, JP;
OHT Inc., Hiroshima, JP;
Abstract
The present invention provides an inspection apparatus and inspection method capable of inspecting the shape of a board used in a liquid crystal panel with high fineness and efficiency. A computercontrols an X-electrode select sectionand a Y-electrode select sectionto drive liquid crystal driving electrodesselectively. A FLASHSHOCK Sensoris located at a position opposed to a boardin a non-contact manner. The FLASHSHOCK Sensoris adapted to detect each potential variation caused in the liquid crystal electrodesand then output the detected potential variation to the computeras a detect signal. The computerreceives the detect signal from the FLASHSHOCK Sensorto create image data, and detects disconnection, short-circuit, chipping or the like in the liquid crystal electrodes based on the created image data. Further, the computerdisplays an image representing each shape of the liquid crystal electrodes on a display