The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2005
Filed:
Dec. 16, 2003
John G. Rohrbaugh, Fort Collins, CO (US);
Jeffrey R. Rearick, Fort Collins, CO (US);
John G. Rohrbaugh, Fort Collins, CO (US);
Jeffrey R. Rearick, Fort Collins, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Methods for testing integrated circuits (ICs) are provided. An exemplary method, in which the IC has a first pad configured as a signal interface for components external to the IC, the first pad having a receiver configured to receive an input signal from a component external to the IC, comprises: electrically interconnecting automated test equipment (ATE) with the IC; providing at least one stimulus to the IC such that the IC measures a receiver termination characteristic of the first pad; and receiving information corresponding to the receiver termination characteristic of the first pad. Systems and integrated circuits also are provided.