The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2005
Filed:
Aug. 13, 2003
Yu Zhou, Vernon Hills, IL (US);
David Yu, Bloomingdale, IL (US);
Advantest Corp., Tokyo, JP;
Abstract
A probe contact system for establishing electrical connection with contact targets. The probe contact system is formed of a main frame, a flexible printed circuit board (PCB), a contactor carrier and a plurality of contactors. The flexible PCB has contact pads at a center area thereof and signal lines connected to the contact pads and extended to an end of the flexible PCB. The end of the flexible PCB with the signal lines is connected to a test head of a semiconductor test system. In one aspect, the contactor has a top spring to resiliently contact with the contact pads on the flexible PCB. In another aspect, the probe contact system includes a conductive elastomer sheet between the contactor and the flexible PCB thereby obviating the top spring of the contactor.