The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2005

Filed:

May. 10, 2000
Applicants:

Hirotaka Nakajima, Kanagawa, JP;

Toshirou Kotooka, Kanagawa, JP;

Yoshiyuki Shimanuki, Kanagawa, JP;

Hiroshi Inagaki, Kanagawa, JP;

Shigeki Kawashima, Kanagawa, JP;

Makoto Kamogawa, Kanagawa, JP;

Inventors:

Hirotaka Nakajima, Kanagawa, JP;

Toshirou Kotooka, Kanagawa, JP;

Yoshiyuki Shimanuki, Kanagawa, JP;

Hiroshi Inagaki, Kanagawa, JP;

Shigeki Kawashima, Kanagawa, JP;

Makoto Kamogawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B013/30 ;
U.S. Cl.
CPC ...
Abstract

There are provided a system for manufacturing a single-crystal ingot which is equipped with a cooler for cooling the single-crystal ingot being pulled and is capable of forming a tail without involvement of excessive heating of a crucible, as well as to a method for controlling the system. In a system for manufacturing a single-crystal ingot having a cooler for cooling a single-crystal ingot which is being pulled from molten raw material (called a single-crystal pulled ingot), when a tail of the single-crystal pulled ingot is formed, the cooler is moved away from the solid/melt interface between the single-crystal ingot and the molten raw material, to thereby reduce the power dissipated by the system. In the system, the cooler is moved upward after the end of a product area of the single-crystal ingot has been cooled until it passes through a grown-in defect temperature range.


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