The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2005
Filed:
Jul. 11, 2003
Shinichi Nakamura, Tokyo, JP;
Eiichi Yanagi, Tokyo, JP;
Shinichi Nakamura, Tokyo, JP;
Eiichi Yanagi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Disclosed are a spectacle lens optical characteristics measuring method and a lens meter in which measurement beams are not intercepted by lens pressers. The left and right lenses of a pair of spectacles are point-supported by lens rest shafts at some midpoints in the optical paths of a pair of left and right measurement optical systems, and the spectacle frame for the lenses is held by a pair of frame retaining plates from the front and rear sides. In this state, the spectacle lenses are pressed against lens rest shafts by lens presser shafts to be thereby supported, whereby the way the spectacle frame is held by the frame retaining plates is corrected. After the correction, the lens presser shafts are retracted from the measurement optical paths of the measurement optical systems, and measurement beams around the lens rest shafts transmitted through the spectacle lenses are received by a CCD of the measurement optical systems, the optical characteristics of the spectacle lenses being obtained by a computation control circuit on the basis of measurement signals from the CCD.