The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2005

Filed:

Apr. 28, 2000
Applicants:

Masanobu Mizuno, Osaka, JP;

Sadashige Sugiura, Shiga, JP;

Kasumi Hamaguchi, Osaka, JP;

Hiroshi Takahashi, Osaka, JP;

Katsuya Fujimura, Kyoto, JP;

Toshiyuki Yokoyama, Kyoto, JP;

Inventors:

Masanobu Mizuno, Osaka, JP;

Sadashige Sugiura, Shiga, JP;

Kasumi Hamaguchi, Osaka, JP;

Hiroshi Takahashi, Osaka, JP;

Katsuya Fujimura, Kyoto, JP;

Toshiyuki Yokoyama, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1750 ;
U.S. Cl.
CPC ...
Abstract

A database for design of an integrated circuit device having data stored therein in a flexibly utilizable state, and a method for designing an integrated circuit device using such a database. A virtual core database (VCDB) for storing design data and a VCDB management system (VCDBMS) as a control system are provided. The VCDB includes virtual core (VC) clusters, test vector clusters, and purpose-specific function testing models. The VCDB also includes a system testing database having shared test clusters and peripheral model clusters. The VCDBMS includes a function testing assist section for generating test scenarios, the purpose-specific function testing models, system testing models, and the like, a VC interface synthesis section, and the like.


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