The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Nov. 26, 2002
Quinn Y. J. Smithwick, Bothell, WA (US);
Eric J. Seibel, Seattle, WA (US);
Mark Fauver, Seattle, WA (US);
Quinn Y. J. Smithwick, Bothell, WA (US);
Eric J. Seibel, Seattle, WA (US);
Mark Fauver, Seattle, WA (US);
University of Washington, Seattle, WA (US);
Abstract
Controls for an optical scanner, such as a single fiber scanning endoscope (SFSE) that includes a resonating optical fiber and a single photodetector to produce large field of view, high-resolution images. A nonlinear control scheme with feedback linearization is employed in one type of control to accurately produce a desired scan. Open loop and closed loops controllers are applied to the nonlinear optical scanner of the SFSE. A closed loop control (no model) uses either phase locked loop and PID controllers, or a dual-phase lock-in amplifier and two PIDs for each axis controlled. Other forms of the control that employ a model use a frequency space tracking control, an error space tracking control, feedback linearizing controls, an adaptive control, and a sliding mode control.