The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2005
Filed:
Jan. 18, 2002
Applicants:
Dominik Grau, Nauendorf, DE;
Andreas Birkner, Jena, DE;
Knut Hiltawski, Saalfeld, DE;
Frank Bernhardt, Kahla, DE;
Inventors:
Dominik Grau, Nauendorf, DE;
Andreas Birkner, Jena, DE;
Knut Hiltawski, Saalfeld, DE;
Frank Bernhardt, Kahla, DE;
Assignee:
Leica Microsystems Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 900 ;
U.S. Cl.
CPC ...
Abstract
An arrangement for the identification of a substrate (S) having at least one identification marking (I), comprising A corresponding identification method is also described.
Grau, Dominik. (2005). Arrangement and method for the identification of substrates (U.S. Patent No. 6845174). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6845174
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile