The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2005

Filed:

Dec. 05, 2002
Applicants:

Kyu-nam Lim, Gyeonggi-do, KR;

Jei-hwan Yoo, Gyeonggi-do, KR;

Young-gu Kang, Gyeonggi-do, KR;

Jong-won Lee, Seoul, KR;

Jae-yoon Shim, Gyeonggi-do, KR;

Inventors:

Kyu-Nam Lim, Gyeonggi-do, KR;

Jei-Hwan Yoo, Gyeonggi-do, KR;

Young-Gu Kang, Gyeonggi-do, KR;

Jong-Won Lee, Seoul, KR;

Jae-Yoon Shim, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 700 ;
U.S. Cl.
CPC ...
Abstract

A semiconductor memory device with a bit line sense enable signal generating circuit is disclosed. The semiconductor memory device includes a word line selection signal generating circuit for generating a word line selection signal for selecting a word line; a delay circuit for generating a delayed signal by delaying a signal to the same extent of time period which is needed for the word line selection signal generating circuit to generate the word line selection signal; and a Schmitt trigger for generating a word line enable detecting signal by receiving an output signal from the delay circuit and that is connected to a power supply voltage which has the same voltage level as the voltage level used to enable the word line. The bit line sense enable signal generating circuit in the present invention occupies a relatively smaller layout area than that of conventional semiconductor memory devices. Furthermore, the generating circuit generates a bit line sense enable signal with constant delay time that is immune from process changes, voltage fluctuations, and temperature fluctuations.


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