The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Apr. 29, 2002
Applicants:

Atsushi Tsurumune, Odawara, JP;

Jiro Mizuno, Yokohama, JP;

Shinichi Ito, Yokohama, JP;

Riichiro Takahashi, Yokohama, JP;

Tatsuhiko Ema, Kamakura, JP;

Inventors:

Atsushi Tsurumune, Odawara, JP;

Jiro Mizuno, Yokohama, JP;

Shinichi Ito, Yokohama, JP;

Riichiro Takahashi, Yokohama, JP;

Tatsuhiko Ema, Kamakura, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2100 ; G02B 1104 ;
U.S. Cl.
CPC ...
Abstract

An ultraviolet microscope comprises an observation device which observes a specimen with ultraviolet light; a gas supply device which, during the observation with ultraviolet light, supplies an inert gas to surroundings of the specimen; and a timing control device which controls supply timing of the inert gas by the gas supply device, and the timing control device controls the gas supply device so as to cause preliminary supply of the inert gas before the observation of the specimen with ultraviolet light, and also so as to cause regular supply of the inert gas at least during the observation of the specimen with ultraviolet light.


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