The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2005
Filed:
Dec. 10, 2001
Kimon D. Roufas, Mountain View, CA (US);
Ying Zhang, Cupertino, CA (US);
David G. Duff, Woodside, CA (US);
Mark H. Yim, Palo Alto, CA (US);
Craig Eldershaw, Tarragindi, AU;
Kimon D. Roufas, Mountain View, CA (US);
Ying Zhang, Cupertino, CA (US);
David G. Duff, Woodside, CA (US);
Mark H. Yim, Palo Alto, CA (US);
Craig Eldershaw, Tarragindi, AU;
Xerox Corporation, Stamford, CT (US);
Abstract
An alignment system includes a first module having a plurality of emitters and a first receiver configuration located on the face of the first module. A second module has a second plurality of emitters and a second receiver configuration located on the face of the second module. First and second trigger signal generators fire the first and second plurality of the emitters. The generated signals are sensed by at least some of the receivers. A converter arrangement obtain and convert the received signals into digital data representative of the readings received by selected receivers. A processing system computes at least one of an absolute six degree offset or a relative six degree offset between the faces. The offset information is then used to achieve a desired alignment between the face of the first module and the face of the second module.