The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2005

Filed:

Apr. 11, 2000
Applicant:

Nobuyuki Irie, Tokyo, JP;

Inventor:

Nobuyuki Irie, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 2742 ; G03B 2754 ; G03B 2772 ;
U.S. Cl.
CPC ...
Abstract

A stitching type exposure apparatus for successively exposing an image of a pattern of a reticle (Ri) on different areas of a surface of a substrate () while overlaying parts of the same, wherein a density filter (Fj) having a light attenuating part for reducing the amount of light of overlaid parts of the image of the pattern in a sloping manner is provided in the vicinity of the reticle (Ri), the density filter (Fj) is held at a filter stage (FS) for adjusting the posture, the posture of the density filter (Fj) is detected by an illumination uniformity sensor () on the substrate stage (), and the posture of the density filter (Fj) is matched with the posture of the reticle (Ri) by the filter stage (FS).


Find Patent Forward Citations

Irie, Nobuyuki. (2005). Exposure apparatus, microdevice, photomask, method of exposure, and method of production of device (U.S. Patent No. 6842225). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6842225

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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