The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2005
Filed:
Sep. 23, 2002
Frans Verbeyst, Merchtem, BE;
Jan Verspecht, Steenhuffel, BE;
Frans Verbeyst, Merchtem, BE;
Jan Verspecht, Steenhuffel, BE;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method of and an arrangement for characterizing non-linear behavior of RF and microwave devices under test in a near matched environment. The method comprises the steps of exciting the device by an RF signal under different load conditions, measuring signal data at input and output ports of the device, verifying whether the measurement data meet predetermined quality criteria; calculating, from the measurement data, model parameters of a predetermined model for characterizing the non-linear behavior of the device, and verifying assumptions made in the characterization model by collecting additional measurement data and comparing same with data calculated from the model using the model parameters calculated. The load conditions are obtained by connecting to the output port of the device a matched load, an open, a short and a plurality of attenuators and delays.