The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2004
Filed:
Sep. 24, 2002
Applicant:
Inventor:
Salem Abdennadher, Sacramento, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 1/100 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 1/100 ; G01R 3/128 ;
Abstract
A method comprises inserting into a behavioral model of an integrated circuit component a corresponding built-in self-test structure from a library of built-in self-test structures that correspond to integrated circuit components and using the behavioral model to verify whether the inserted built-in self-test structure would detect a fault in the component.
Abdennadher, Salem. (2004). On-chip testing of integrated circuits (U.S. Patent No. 6836872). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6836872
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile