The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Nov. 14, 2002
Chunhe Gong, Niskayuna, NY (US);
Narendra Amalendu Soman, Niskayuna, NY (US);
Dean Michael Robinson, Schenectady, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for performing geometric dimension and tolerance stack-up analysis for an assembly, the method comprising receiving a target assembly dimension for stack-up analysis, where the assembly includes at least one part. The method further comprises receiving a feature corresponding to the part and receiving feature tolerance data associated with the feature. The feature tolerance data includes at least one of size tolerance and geometric tolerance. Stack-up rules are accessed in response to receiving the feature tolerance data. The stack-up rules include instructions to determine if a form tolerance, an orientation tolerance and a profile tolerance should be included in a stack-up tolerance for the feature. The stack-up rules also include formulas to calculate a nominal dimension and the stack-up tolerance for the feature when the feature tolerance data applies to features of sizes. The nominal dimension and the stack-up tolerance are derived in response to the stack-up rules and the feature tolerance data. Stack-up analysis is performed in response to the nominal dimension and the stack-up tolerance. Performing stack-up analysis results in a mean and standard deviation for the target assembly dimension.