The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2004
Filed:
Jul. 02, 2002
Klaus Rinn, Heuchelheim, DE;
Leica Microsystems Semiconductor GmbH, Wetzlar, DE;
Abstract
The present invention relates to a method and a measurement apparatus for detection of a specimen ( ), a specimen ( ) being illuminated with a light source ( ) and imaged with the aid of an imaging optical system ( ) onto a detector ( ) preferably embodied as a CCD camera, and the specimen ( ) being detected repeatedly with the detector ( ). With the method and the measurement apparatus according to the present invention, fluctuations in the statistical analysis of detected signals or data can be minimized, the detected signals or data being subject to detection-related error sources. The method and the measurement apparatus according to the present invention are characterized in that the detection time of the detector ( ) for the individual detections and/or the intensity of the light serving for specimen illumination are varied.