The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2004

Filed:

Jul. 08, 2002
Applicant:
Inventors:

Samuel J. Cole, Portland, OR (US);

Ric DeHoff, Hillsboro, OR (US);

Edward D. Seeberger, Jr., Portland, OR (US);

Assignee:

CyberOptics Corporation, Golden Valley, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A wafer mapping system includes an imaging array, at least one lighting module and a controller coupled to the imaging array and the lighting module. The controller is adapted to receive information relative to an initial acquired wafer image and adjust illumination from the lighting module based upon the initial acquired wafer image, and acquire a subsequent wafer image using the adjusted illumination.


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