The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2004

Filed:

Feb. 22, 2002
Applicant:
Inventors:

Jean-Luc Truche, Los Altos, CA (US);

Jian Bai, Mountain View, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4/904 ; H01J 4/926 ; H01J 4/940 ; H01J 4/942 ;
U.S. Cl.
CPC ...
H01J 4/904 ; H01J 4/926 ; H01J 4/940 ; H01J 4/942 ;
Abstract

An apparatus and method for use with a mass spectrometer, in which an ion enhancement system directs a heated gas to heat ions produced by a matrix based ion source and detected by a detector of the mass spectrometer. The ion enhancement system is interposed between the ion source and the detector of the mass spectrometer. The analyte ions that contact the heated gas are enhanced to increase the number and/or intensity of ions detected by the detector of the mass spectrometer. The method includes producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the analyte ions with the detector of the mass spectrometer.


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