The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2004

Filed:

Apr. 03, 2000
Applicant:
Inventors:

Mark J. DelaRosa, Latham, NY (US);

Toh-Ming Lu, Loudonville, NY (US);

Atul Kumar, Watervliet, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/3485 ;
U.S. Cl.
CPC ...
H01L 2/3485 ;
Abstract

Structures and methods for preventing fluorine diffusion from a fluorinated dielectric material having a low dielectric constant are disclosed. Various fluorine diffusion barriers are described, each of which comprises doped or undoped silicon in combination with tantalum, tantalum nitride, tantalum silicide, cobalt, cobalt silicide, or mixtures thereof. Fluorine diffusion from fluorinated dielectrics is stopped by the barriers at temperatures as high as 450° C. In practice, one of the disclosed fluorine diffusion barriers is positioned between a fluorine-containing insulator and a conductive metal interconnect or metal interconnect diffusion barrier, thereby preventing diffusion of the fluorine atoms into the adjacent interconnect/barrier.


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