The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2004

Filed:

Sep. 27, 2002
Applicant:
Inventors:

Hyung-shin Kwon, Kyungki-do, KR;

Won-suek Cho, Kyungki-do, KR;

Byung-jun Hwang, Kyungki-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1336 ; H01L 2/18234 ;
U.S. Cl.
CPC ...
H01L 2/1336 ; H01L 2/18234 ;
Abstract

A method of fabricating an integrated circuit device comprises forming a refractory metal layer on a silicon-containing substrate, processing the refractory metal layer to form an amorphous metal silicide layer, and depositing an insulating material on the amorphous metal silicide layer. The insulating material is deposited at a temperature that maintains at least a portion of the amorphous metal silicide layer in an amorphous state, to form a capping structure that contains the amorphous metal silicide layer. The method further includes crystallizing the contained amorphous metal silicide layer, and forming an etching stop layer on the capping structure.


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