The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Sep. 09, 2002
Applicant:
Inventors:

Hua-yu Liu, Palo Alto, CA (US);

Weinong Lai, Fremont, CA (US);

Xiaoyang Li, Fremont, CA (US);

Assignee:

Numerical Technologies, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 1/900 ;
Abstract

One embodiment of the invention provides a system that facilitates optical proximity correction for alternating aperture phase shifting designs. During operation, the system receives a layout, which includes a complementary mask and a phase shifting mask. A subset of trim features on the complementary mask that are designed to protect the dark areas left unexposed by the phase shifting mask are adjusted first using a rules-based optical proximity correction process. This is then supplemented by a model-based correction to the phase shifters, Additionally, the portions of the trim that are co-extensive with the original layout can be corrected, e.g. at the time of the correction of the complementary mask using either rule or model based corrections.


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