The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2004

Filed:

Dec. 10, 2002
Applicant:
Inventors:

Kan Tan, Beaverton, OR (US);

Benjamin A. Ward, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/320 ;
U.S. Cl.
CPC ...
G01R 1/320 ;
Abstract

A test and measurement apparatus and method wherein a software implemented phase lock loop recovers a clock signal associated with the received data signal, the recovered clock signal being used to do TIE measurement, to generate eye diagram and to do mask testing.


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