The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 2004
Filed:
Jul. 23, 2003
Applicant:
Inventor:
Albert Kreh, Solms, DE;
Assignee:
Leica Microsystems Semiconductor GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/740 ; G02B 2/764 ; G02B 7/04 ;
U.S. Cl.
CPC ...
G02B 2/740 ; G02B 2/764 ; G02B 7/04 ;
Abstract
An autofocus module ( ) for a microscope-based system ( ) is equipped in such a way that a light source ( ) which generates a measurement light bundle ( ) is provided. A first axicon ( ) generates an eccentrically extending annularly divergent measurement light beam bundle ( ). A second axicon ( ) is provided in order to parallelize the remitted divergent measurement light beam bundle ( ). A differential diode ( ) is mounted in the module ( ) for determination of the focus position.