The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 2004

Filed:

Jun. 29, 2000
Applicant:
Inventors:

Richard J. Qian, Camas, WA (US);

Eugene Epshteyn, Hillsboro, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract

A method of and a system for collecting, data about an event and describing the event, which for example, might be an entertainment event, a sports event, or a political event. Identifying characteristics of the event, characteristics of types of data about the event, and a record of the event are acquired by a description generator. A person wishing to view a particular type of data utilizes an interactive receiver to select the type of data, and characteristics of the selected type of data within the record of the event are located so as to locate data of the selected type. The located data are then collected and displayed. By storing characteristics of different types of segments that occur in the event, a viewer can select segments of a particular type for viewing. Characteristics of the selected type of segments are then located within the record of the event so as to locate segments of the selected type, and the located segments are then displayed.


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