The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2004
Filed:
Mar. 08, 2002
Kenji Shimazaki, Kobe, JP;
Shouzou Hirano, Ibaraki, JP;
Ritsuko Kurazono, Takatsuki, JP;
Masanori Tsutsumi, Kyoto, JP;
Kaori Matsui, Kyoto, JP;
Hisato Yoshida, Kashihara, JP;
Hiroyuki Tsujikawa, Kusatsu, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
An electromagnetic disturbance analysis method for analyzing an external noise to a semiconductor integrated circuit includes an impedance extraction step of extracting impedance information on the power wiring in the target semiconductor integrated circuit or the power wiring in the semiconductor integrated circuit and the external power wiring of the semiconductor integrated circuit, an equivalent circuit creating step of creating an equivalent circuit from the impedance information, and an analysis step of supplying a noise waveform externally and analyzing the influence of the noise on the semiconductor integrated circuit.