The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2004
Filed:
May. 22, 2003
William E. Corr, Twickenham, GB;
Micron Technology, Inc., Boise, ID (US);
Abstract
The invention relates to a method for measuring the effects of on-chin noise on signal propagation comprising measuring an inactive operating frequency of a first test circuit having a first plurality of elements connected by a first plurality of traces, measuring an inactive operating frequency of a second test circuit having a second plurality of elements connected by a second plurality of traces, measuring an inactive operating frequency of a third test circuit having a third plurality of elements connected by a third plurality of traces, and measuring an inactive operating frequency of a fourth test circuit having a fourth plurality of elements connected by a fourth plurality of traces, wherein the inactive operating frequencies of the first second, third, and fourth test circuits represent one or more effects of on-chin noise on signal propagation.