The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6806027 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 19, 2004

Filed:

Jul. 30, 2002
Applicant:
Inventors:

Christoph Hohle, Bubenreuth, DE;

Jörg Rottstegge, Erlangen, DE;

Christian Eschbaumer, Schwaig, DE;

Michael Sebald, Weisendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 ; G03F 7/26 ;
U.S. Cl.
CPC ...
G03F 7/004 ; G03F 7/26 ;
Abstract

Chemically amplified photoresists exhibit increased transparency at a wavelength of 157 nm. The chemically amplified photoresist includes a polymer containing first repeating units derived from a cinnamic acid or a cinnamic ester, which are at least monofluorinated or substituted by fluoroalkyl groups. Processes for structuring substituents using transparency enhancement of resist copolymers for 157 nm photolithography using fluorinated cinnamic acid derivatives are also included.


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Hohle, Christoph. (2004). Chemically amplified photoresist and process for structuring substituents using transparency enhancement of resist copolymers for 157 nm photolithography through the use of fluorinated cinnamic acid derivatives (U.S. Patent No. 6806027). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6806027

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