The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2004
Filed:
May. 03, 2002
Applicant:
Inventors:
Michael John Adams, Olmstead Falls, OH (US);
William H. Howland, Jr., Wexford, PA (US);
William J. Alexander, Pittsburgh, PA (US);
Assignee:
Solid State Measurements, Inc., Pittsburgh, PA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10R 3/102 ;
U.S. Cl.
CPC ...
G10R 3/102 ;
Abstract
A sample chuck for supporting sample semiconductor wafers during testing includes an upper layer formed from a semiconducting material laminated to a lower layer formed from a conducting material.
Adams, Michael. (2004). Sample chuck with compound construction (U.S. Patent No. 6803780). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6803780
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile