The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2004

Filed:

Jun. 04, 2001
Applicant:
Inventors:

James R. Peterson, Portland, OR (US);

Zhi Cong Luo, Cupertino, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/717 ;
U.S. Cl.
CPC ...
G06F 1/717 ;
Abstract

A system and method for calculating an output value from a plurality of input sample values contributing to the output value in accordance with a respective weight value. A first intermediate value is interpolated for a first offset value from a first plurality of the input sample values and a second intermediate value is interpolated for a second offset value from a second plurality of the input sample values. The offset values are representative of the weight values of the input samples of the respective plurality of the input samples. The first and second intermediate values are combined to produce a resultant value which is subsequently blended with the remaining input sample values of the plurality in accordance with respective scaling values assigned to the resultant value and the remaining input sample values.


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