The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2004
Filed:
May. 22, 2003
William E. Corr, Twickenham, GB;
Micron Technology, Inc., Boise, ID (US);
Abstract
The invention relates to an apparatus for dynamically testing an integrated circuit having a core logic area. The apparatus comprises a first test circuit having a first plurality of elements connected by a first plurality of traces wherein the first test circuit mimics a data path within the integrated circuit, a second test circuit having a second plurality of elements connected by a second plurality of traces wherein the second plurality of traces are routed within the core logic area, a third test circuit having a third plurality of elements connected by a third plurality of traces wherein the third plurality of elements are randomly located within the core logic area, and a fourth test circuit having a fourth plurality of elements connected by a fourth plurality of traces wherein the fourth test circuit mimics a data path within the integrated circuit.