The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Oct. 03, 2002
Bert Jannsen, Braunschweig, DE;
Arne Jacob, Braunschweig, DE;
Technische Universitat Braunschweig Carolb-Wilhelmina, Braunschweig, DE;
Abstract
An apparatus for determining the properties of a material, that is to be examined, by applying a swept-frequency high frequency signal and measuring a reflection factor of the resonance signal. The apparatus has a microwave supply conductor for feeding the high frequency signal, a sensor waveguide that is coupled to the microwave supply conductor, a helical conductor that is arranged inside the sensor waveguide, and an intermediate layer between a first end of the sensor waveguide and the helical conductor. Typically, the sensor waveguide is cylindrical and the helical conductor is supported centrally therein along the longitudinal axis of the sensor waveguide by a support that is part of the intermediate layer. A coupling layer is provided between the helical conductor and the material to be examined in the region of a second end face of the sensor waveguide.