The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
Dec. 14, 1999
Akihito Otani, Atsugi, JP;
Toshinobu Otsubo, Atsugi, JP;
Anritsu Corporation, Tokyo, JP;
Abstract
A delay time measurement apparatus for an optical element includes a pulse light source, wavelength setting unit, optical power divider, optical delay unit, controller, and detector. The pulse light source can vary the wavelength of light to be output, and outputs an optical pulse having a predetermined repetition period. The wavelength setting unit sets the wavelength of light to be output from the pulse light source. The optical power divider divides the optical pulse output from the pulse light source into a first optical pulse and a second optical pulse to be input to an optical element as the object to be measured. The optical delay unit can vary the spatial optical path length along which the first optical pulse divided by the optical power divider travels. The controller changes the spatial optical path length of the optical delay unit. The detector receives a measurement optical pulse output from the optical element as the object to be measured, and a reference optical pulse output from the optical delay unit, and detects the delay time of light that has passed through the optical element as the object to be measured from a change in spatial optical path length required for superposing the measurement and reference optical pulses on each other.